Universal Access To All Knowledge
Home Donate | Store | Blog | FAQ | Jobs | Volunteer Positions | Contact | Bios | Forums | Projects | Terms, Privacy, & Copyright
Search: Advanced Search
Anonymous User (login or join us)
Upload
Search Results
Results: 1 through 1 of 1 (0.005 secs)
You searched for: mediatype:texts AND collection:NISTTechNotes AND subject:"Thin Films--Optical Properties."
[texts]A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films (Volume NBS Technical Note 242) - McCrackin, Frank L.; Colson, James P.

Keywords: Thin films--Optical properties; FORTRAN (Computer program language)
Downloads: 171
Advanced search

Group results by:

> Relevance
Mediatype
Collection

Related mediatypes

texts

Terms of Use (10 Mar 2001)